Laser pulse distance measurement in real time (> 100MHz)

This invention is based on optics and analog electronics. The process achieves real-time process control with extraordinary measurement rates up to over 100 MHz. It is based on spectral interferometry and compares the differences in path lengths in reference and sample paths. The Dispersive Fourier Transform processes the analog signals at unmatched speed. The electrical measurement signal can be directly fed back to change the processing exposure between successive laser shots. The robust technology is based on standardized low cost components.
Physical Sciences
Mechanical Engineering
Reference
b78038
IP right year
2019
IP status
Granted in DE, FR, GB, CN, US
Patentee
University of Bayreuth
Contact
Stephan Ottmar

Challenge and innovation

Fast and precise control of processing depths between the laser head and the workpiece limits the process speed of a variety of potential micro-laser processing operations for ablation, cutting or tructuring. This reduces efficiency. Current measurement methods, based on white-light interferometry or optical coherence tomography, achieve scan rates in the hertz up to kilohertz range - characteristically after machining has been completed or in time-average.

To accurately modulate or interrupt exposure, many applications require a shot-to-shot monitoring in real time. Wherever irregular inhomogeneous materials (e.g., organic structures or fiber-reinforced components) are processed with high precision, compromises between accuracy and operating speed limit process efficiency. Particularly high demands arise especially in medical eye treatment and skin ablation, but also in battery or solar cell production, where electrical insulation must be ablated in a defined manner.

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